Hellow guys, Welcome to my website, and you are watching From Wafer to Chip:Next Generation Inspection and Metrology Solutions for the Semiconductor Industry. and this vIdeo is uploaded by MADEin4 at 2022-09-21T04:44:18-07:00. We are pramote this video only for entertainment and educational perpose only. So, I hop you like our website.
| Name | From Wafer to Chip:Next Generation Inspection and Metrology Solutions for the Semiconductor Industry |
| Video Uploader | Video From MADEin4 |
| Upload Date | This Video Uploaded At 21-09-2022 11:44:18 |
| Video Discription | For the semiconductor industry time is money. With demand for smaller, more sophisticated chips rising with each new generation of technology, many manufacturers look for time-efficient solutions to ramp up high-volume production while avoiding defects when decreasing dimensions and new materials are introduced. Measuring near-atomic scale, modern-day semiconductor manufacturing requires an inspection to be highly precise and accurate, setting new standards on reliability and efficiency of metrology tools and processes along the assembly line. And while finding defects and fighting disruptions is becoming more challenging and costly every year, it is easier and more affordable than you think to implement change and gain an immediate return on investment. Join our experts from the MADEin4 project and discover how the next generation of innovations in metrology and inspection for the semiconductor (and automotive) industry can help your business to drive technological improvement and increase profitability. About The MADEin4 Project: The MADEin4 Project develops next-generation metrology tools, machine learning methods, and applications in support of Industry 4.0 high-volume manufacturing in the semiconductor and automotive manufacturing industries. Addressing a broad range of electronic components and systems (ECS) technologies, MADEin4 aims to demonstrate Industry 4.0 manufacturing productivity improvement by developing advanced, highly connected metrology cyber-physical systems, combining metrology data analysis and design with machine learning methodologies and digital twinning. MADEin4 is a consortium of 47 partners from 10 countries connecting the full range of the supply chain: from semiconductor equipment manufacturers and system-integrating metrology companies to RTOs and organizations working on key application areas such as the automotive industry. |
| Category | Science & Technology |
| Tags | semiconductor | semiconductorindustry | #industrialautomation | smartmanufacturing | #microelectronics | inspection | metrology | technoloy | innovation | digitaltwins | digitaltwin | artificialintelligence | ai | germanindustry | europeanindustry | europeantechnology | eu | euproject |
